Kyoritsu KEW 5410 is a high-performance RCD Tester designed to evaluate the functionality and safety of Residual Current Devices (RCDs). RCDs are essential components in electrical systems, providing protection against electric shocks and preventing potential hazards caused by leakage currents. The KEW 5410 ensures that RCDs are operating correctly, meeting safety standards.
Specification
Measurement of RCD trip time – Measurement of trip out current |
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Range | × 5 | × 1 | × 1/2 | AUTO RAMP(mA) | ||
Rated Voltage | 100V±10% 200V-10 to +32% 400V±10% 50/60Hz |
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Test current | 15/30/50/100mA | 15/30/50/100/200/500mA | ||||
Measuring range | Testing time 0 to 200ms |
Testing time 0 to 2000ms |
40 to 110% of lΔn (goes up by 5%) Testing time 300ms × 15steps |
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Accuracy | Trip Time | 1%rdg±3dgt | Test Current at each step -4 to +4% |
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Trip Time | +2 to +8%dgt | -8 to -2%dgt | Test Current at each step -4 to +4% |
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Voltage Measurement |
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Measuring range | 80 to 450V 50/60Hz | |||||
Accuracy | 2%rdg±4dgt | |||||
Applicable standards | IEC 61010-1 CAT Ⅲ 300V / CAT Ⅱ 400V Pollution degree2 IEC 61010-031, IEC 61557-1, 6 IEC 60529 (IP54) |
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Display | 1999 counts (3 1/2digits), Large LCD | |||||
Operating temperature and humidity range |
0 to 40ºC, relative humidity 85% (no condensation) | |||||
Storage temperature and humidity range |
-20 to 60ºC, relative humidity 75% (no condensation) | |||||
Insulation resistance | 50MΩ or more / 1000V (between electrical circuit and enclosure) | |||||
Sleep Function | (1)Automatically enters Sleep mode in 3 minutes after the last switch operation (current consumption 75µA). This function doesn’t work at voltage measurements. To exit from the Sleep mode, set the Function switch to OFF position once, and re-set it to the Range at which a measurement to be conducted. (2) Backlight turns off in 1 minute after it lights up. | |||||
Power source | DC 12V / R6(AA)(1.5V) × 8 | |||||
Dimension | 167(L)×186(W)×89(D)mm | |||||
Weight | Approx. 965g (including batteries) | |||||
Possible number of Measurements | 1200 times or more (measure every 30 seconds at ×1/2 Range, lΔn=100mA) |
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